Sem USB All In One Scanning Electron Atomic Force Microscope Opto Edu A62.4501

1. Scan head and sample stage are designed together, strong anti-vibration performance
2. Precision laser detection and probe alignment device make laser adjustment simple and easy;
3. Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
4. High-accuracy and large range sample transfer device allow to scan any interesting area of sample ;
5. Optical observation system for tip check and sample positioning.
6. Electronic system is designed as modular and easy for maintenance and further development.
7. Adopt spring for vibration isolation, simple and good performance.

Software
1. Two kinds of sampling pixel for choose: 256×256, 512×512;
2. Execute scan area move and cut function, choose any interesting area of sample;
3. Scan sample in random angle at beginning;
4. Adjust the laser spot detection system in real time;
5. Choose and set different color of scanning image in palette.
6. Support linear average and offset calibration in real time for sample title;
7. Support scanner sensitivity calibration and electronic controller auto-calibration;
8. Support offline analysis and process of sample image.

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